Continued preparations to act as an independent agent to validate that simulators pass all required CMC Model QA tests for the built-in versions of any Standard Model
Streamlined Core Processes
The CMC has optimized the model development and release process, including enhanced workflow, improved time-to-market and heightened quality of models at release
New Model Standardizations
Candidate: Electrostatic Discharge | ESD
While the ESD diode is widely used, available diode models do not operate in ESD regimes. This group is developing a standard model capable of supporting the various application scenarios and features needed in ESD simulations.
Status: Phase IV – Preparation for Industrial Use
Candidate: Silicon Carbide | SiC
Featuring high efficiency and fast operation with low switching losses, silicon carbide-based metal-on-silicon-field effect transistors are popular in high-growth semiconductor applications.
Status: Phase I – Developer and Code Evaluations
Candidate: Random Telegraph Noise | RTN
As device geometries shrink, random variations in a device electrical performance rapidly increase. A standard model of these RTN variations will allow for some of these electrical device variations, which will have a serious impact on circuit yield.